POWER SEMICONDUCTOR DEVICE

To provide a power semiconductor device that is small in size and that has low inductance, and that can reduce fluctuation in resistance value of a control resistor caused by heat generation of a semiconductor element.SOLUTION: A power semiconductor device comprises: a first conductive pattern layer...

Full description

Saved in:
Bibliographic Details
Main Authors TANIGUCHI KATSUMI, HORI MOTOHITO
Format Patent
LanguageEnglish
Japanese
Published 13.06.2019
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:To provide a power semiconductor device that is small in size and that has low inductance, and that can reduce fluctuation in resistance value of a control resistor caused by heat generation of a semiconductor element.SOLUTION: A power semiconductor device comprises: a first conductive pattern layer 11_1; semiconductor elements Q1-Q6 individually bonded on an upper surface of the first conductive pattern layer 11_1; a second conductive pattern layer 11_2a separated from the first conductive pattern layer 11_1; a control terminal 53 bonded with the second conductive pattern layer 11_2a; a control resistor 20 bonded on an upper surface of the second conductive pattern layer 11_2a; a control resistor pin 21 bonded on an upper surface of the control resistor 20; and a wiring board 4 that has a control wiring pattern layer 41 for electrically connecting among the semiconductor elements Q1-Q6 and the control resistor pin 21.SELECTED DRAWING: Figure 4 【課題】小型且つ低インダクタンスであり、半導体素子の発熱に起因する制御抵抗の抵抗値の変動を低減可能な電力用半導体装置を提供する。【解決手段】第1導電性パターン層11_1と、第1導電性パターン層11_1の上面にそれぞれ接合された半導体素子Q1〜Q6と、第1導電性パターン層11_1と離間した第2導電性パターン層11_2aと、第2導電性パターン層11_2aに接合された制御端子53と、第2導電性パターン層11_2aの上面に接合された制御抵抗20と、制御抵抗20の上面に接合された制御抵抗ピン21と、半導体素子Q1〜Q6と制御抵抗ピン21との間を電気的に接続する制御配線パターン層41を有する配線基板4とを備える。【選択図】図4
Bibliography:Application Number: JP20170221002