SEMICONDUCTOR DEVICE

To provide a semiconductor device capable of obtaining desired output characteristics corresponding to an application.SOLUTION: A semiconductor device 10 comprises: a temperature detector 11 that generates an analog detection signal depending on a temperature; and an AD converter 12 that, on the bas...

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Bibliographic Details
Main Author YAYAMA KOSUKE
Format Patent
LanguageEnglish
Japanese
Published 09.05.2019
Subjects
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Summary:To provide a semiconductor device capable of obtaining desired output characteristics corresponding to an application.SOLUTION: A semiconductor device 10 comprises: a temperature detector 11 that generates an analog detection signal depending on a temperature; and an AD converter 12 that, on the basis of a temperature change rate adjustment signal for adjusting a temperature change rate, converts the analog detection signal into a digital output signal depending on the adjusted temperature change rate. The temperature change rate indicates a change in detection temperature per bit of the digital output signal.SELECTED DRAWING: Figure 1 【課題】アプリケーションに対応した所望の出力特性を得ることが可能な半導体装置を提供することができる。【解決手段】半導体装置１０は、温度に応じたアナログのアナログ検知信号を生成する温度検知部１１と、温度変化率を調整する温度変化率調整信号に基づいて、アナログ検知信号を調整された温度変化率に応じたデジタルのデジタル出力信号に変換するＡＤ変換部１２と、を備えるものである。温度変化率は、デジタル出力信号のビット当たりの検出温度の変化である。【選択図】図１
Bibliography:Application Number: JP20180231478