MEASUREMENT SUPPORT SYSTEM

• Main Authors: HIRAOKA SABURO, ONAKA KENICHI, TAMURA KISHIOMI
• Format: Patent
• Language: English; Japanese
• Published: 22.03.2019
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; SIGNALLING; TARIFF METERING APPARATUS; TESTING; TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS

To provide a measurement support system that can reduce measurement time in measurement work.SOLUTION: A measurement support system 100 comprises: an electronic measure body 31 that conducts measurement on distance; a measurement determination unit 32 that determines a measured value of the electronic measure body 31; a head-mounted display body 40 that displays the measured value; a display imaging unit 42 that picks up an image of a measurement place at which the determined measured value is measured; and a storage unit that stores the picked-up image picked up by the display imaging unit 42 as measurement data including the measured value and measurement place.SELECTED DRAWING: Figure 1 【課題】測定作業において、測定時間を短縮可能な測定支援システムを提供すること。【解決手段】測定支援システム１００は、距離に関する測定を行う電子メジャー本体３１と、電子メジャー本体３１の測定値を決定する測定決定部３２と、測定値を表示するヘッドマウントディスプレイ本体４０と、決定した測定値を測定した測定場所を撮像する表示撮像部４２と、表示撮像部４２で撮像された撮像画像を、測定値及び測定場所を含む測定データとして保存する記憶部とを備える。【選択図】図１