ANALYZER AND PROGRAM

• Main Authors: ICHIMARU NAOTO, IWASAKI SACHIKO
• Format: Patent
• Language: English; Japanese
• Published: 28.02.2019
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To rapidly and simply perform an infrared spectroscopic analysis and a fluorescent x-ray analysis.SOLUTION: An analyzer includes: an infrared spectrum measurement unit for measuring an infrared spectrum of an object; a fluorescent X-ray spectrum measurement unit for measuring a fluorescent x-ray spectrum of the object; and a measurement control unit for controlling the measurement by the infrared spectrum measurement unit and the fluorescent X-ray spectrum measurement unit.SELECTED DRAWING: Figure 1 【課題】迅速かつ簡便に赤外分光分析および蛍光Ｘ線分析を行う。【解決手段】分析装置は、対象物の赤外線スペクトルを測定する赤外線スペクトル測定部と、対象物の蛍光Ｘ線スペクトルを測定する蛍光Ｘ線スペクトル測定部と、赤外線スペクトル測定部および蛍光Ｘ線スペクトル測定部における測定を制御する測定制御部と、を備える。【選択図】図１