INSPECTION CHIP, INSPECTION DEVICE, AND INSPECTION SYSTEM
To facilitate inspection of dielectric particles included in a test liquid.SOLUTION: Provided is an inspection chip for inspecting dielectric particles included in a test liquid. The inspection chip comprises a passage, a first electrode group, and a second electrode group. The test liquid flows in...
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Main Authors | , , , , , |
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Format | Patent |
Language | English Japanese |
Published |
06.12.2018
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Subjects | |
Online Access | Get full text |
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Summary: | To facilitate inspection of dielectric particles included in a test liquid.SOLUTION: Provided is an inspection chip for inspecting dielectric particles included in a test liquid. The inspection chip comprises a passage, a first electrode group, and a second electrode group. The test liquid flows in the passage. The first electrode group includes a plurality of electrodes arranged in the passage by being spaced apart from each other. The second electrode group includes a plurality of electrodes arranged in parallel to the first electrode group in the longitudinal direction of the passage by being spaced apart from each other. The passage is provided with a narrowed portion such that the passage width in a range where the second electrode group is arranged is reduced to be narrower than the passage width in a range where the first electrode group is arranged.SELECTED DRAWING: Figure 2
【課題】試料液中に含まれる誘電体粒子の検査を行い易くする。【解決手段】試料液中に含まれる誘電体粒子の検査を行うための検査チップである。検査チップは、流路と、第1の電極群と、第2の電極群とを備える。流路には、試料液が流れる。第1の電極群は、流路において互いに間隔をあけて配置された複数の電極を含む。第2の電極群は、流路の長手方向において第1の電極群に並び、互いに間隔をあけて配置された複数の電極を含む。流路は、第1の電極群が配置された範囲における流路幅よりも第2の電極群が配置された範囲における流路幅を狭める狭窄部を備える。【選択図】図2 |
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Bibliography: | Application Number: JP20170098882 |