LEARNING APPARATUS, LEARNING METHOD, AND LEARNING PROGRAM

• Main Author: ANDO TANICHI
• Format: Patent
• Language: English; Japanese
• Published: 29.11.2018
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

PROBLEM TO BE SOLVED: To provide a technique capable of specifying the number of deficient cases of learning data used for machine learning.SOLUTION: A learning apparatus according to one aspect of the present invention comprises: a learning data acquisition unit for acquiring a first learning data group constituted of a plurality of pieces of learning data to make a learning device perform the machine learning of a predetermined ability; a learning processing unit for executing the machine learning of the learning device using the first learning data group to construct a first learning device to learn the predetermined ability; and a deficiency count evaluation unit for evaluating a degree of the number of deficient cases of learning data used for the machine learning of the first learning device on the basis of a result of the first learning device exhibiting the predetermined ability with respect to sample data.SELECTED DRAWING: Figure 3 【課題】機械学習に利用する学習データの不足件数を特定可能な技術を提供する。【解決手段】本発明の一側面に係る学習装置は、複数件の学習データで構成され、所定の能力を学習器に機械学習させるための第１の学習データ群を取得する学習データ取得部と、前記第１の学習データ群を利用して、前記学習器の機械学習を実施することで、前記所定の能力を学習した第１の学習器を構築する学習処理部と、前記第１の学習器がサンプルデータに対して前記所定の能力を発揮した結果に基づいて、前記第１の学習器の機械学習に利用した学習データの不足件数の程度を評価する不足件数評価部と、を備える。【選択図】図３