INFRARED-RAY IMAGING DEVICE, INFRARED-RAY IMAGING SYSTEM AND INFRARED-RAY IMAGING METHOD

• Main Authors: TAMURA TETSUO, TAKANO EIJI, OYANAGI TOSHIYASU, OKUBO SHUICHI
• Format: Patent
• Language: English; Japanese
• Published: 15.11.2018
• Subjects: ACCESSORIES THEREFOR; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES; APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM; CINEMATOGRAPHY; COLORIMETRY; ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; ELECTROGRAPHY; HOLOGRAPHY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHOTOGRAPHY; PHYSICS; PICTORIAL COMMUNICATION, e.g. TELEVISION; RADIATION PYROMETRY; TESTING

PROBLEM TO BE SOLVED: To provide an infrared-ray imaging device that can accurately detect temperatures of materials low in emissivity.SOLUTION: An infrared-ray imaging device is configured to calculate temperatures of measurement objects standing at a temperature equal to or more than 150°C using an image pick-up element having main light reception sensitivity in a wavelength between 0.9 mm and 1.7 mm, and thereby is enabled to correctly measure the temperature of the measurement object low in emissivity without being affected by a disturbance. Since the image pick-up element to be used in the infrared-ray imaging device does not need to be cooled to a liquid nitrogen temperature, the image pick-up element can be inexpensively and compactly formed.SELECTED DRAWING: Figure 1 【課題】放射率の低い材料の温度を精度よく検出することができる赤外線撮影装置を提供する。【解決手段】波長0.9〜1.7 mmに主たる受光感度を有する撮影素子と、この撮影素子を用いて、150℃以上の温度にある測定対象物の温度を算出することにより、放射率の低い測定対象物の温度を、外乱の影響を受けることなく正確に計測することが可能とした赤外線撮影装置である。この赤外線撮影装置に用いられる撮影素子は液体窒素温度に冷却する必要がないので、安価かつ小型に形成することができる。【選択図】図１