MEMORY DEVICE AND CONTROL METHOD OF MEMORY DEVICE
PROBLEM TO BE SOLVED: To provide a high-quality memory device.SOLUTION: A memory device includes a memory cell and a first circuit. The first circuit performs a first read for the memory cell and generates a first voltage; writes first data to the memory cell for which the first read has been perfor...
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Main Authors | , , |
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Format | Patent |
Language | English Japanese |
Published |
18.10.2018
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide a high-quality memory device.SOLUTION: A memory device includes a memory cell and a first circuit. The first circuit performs a first read for the memory cell and generates a first voltage; writes first data to the memory cell for which the first read has been performed; performs a second read for the memory cell to which the first data has been written, and generates a second voltage; generates a first current based on the first voltage; generates a second current based on the second voltage; and adds a third current to the first current or second current, to determine data which has been stored in the memory cell at the time of the first read.SELECTED DRAWING: Figure 6
【課題】高品質なメモリデバイスを提供する。【解決手段】メモリデバイスは、メモリセルと、メモリセルに対して第1読み出しを行い、第1電圧を生成し、第1読み出しを行ったメモリセルに、第1データを書込み、第1データが書き込まれたメモリセルに対して第2読み出しを行い、第2電圧を生成し、第1電圧に基づく第1電流を生成し、第2電圧に基づく第2電流を生成し、第1電流または第2電流に、第3電流を加えることで、第1読み出し時にメモリセルに記憶されていたデータを判定する第1回路と、を備える。【選択図】 図6 |
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Bibliography: | Application Number: JP20170153565 |