SEMICONDUCTOR STORAGE DEVICE

PROBLEM TO BE SOLVED: To provide a semiconductor storage device having a high reliability.SOLUTION: A semiconductor storage device comprises: a semiconductor member that extends in a first direction; first wiring that extends in a second direction crossing the first direction; and a first electrode...

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Bibliographic Details
Main Authors NAGASHIMA MASASHI, KATO TATSUYA, ARAI FUMITAKA, SAKAIKE KOHEI
Format Patent
LanguageEnglish
Japanese
Published 04.10.2018
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Summary:PROBLEM TO BE SOLVED: To provide a semiconductor storage device having a high reliability.SOLUTION: A semiconductor storage device comprises: a semiconductor member that extends in a first direction; first wiring that extends in a second direction crossing the first direction; and a first electrode arranged between the semiconductor member and the first wiring. A curvature radius of a corner part opposed to the semiconductor member in the first electrode is larger than that of a corner part opposed to the first wiring in the first electrode.SELECTED DRAWING: Figure 4 【課題】信頼性が高い半導体記憶装置を提供する。【解決手段】半導体記憶装置は、第1方向に延びる半導体部材と、前記第1方向に対して交差した第2方向に延びる第1配線と、前記半導体部材と前記第1配線との間に配置された第1電極と、を備える。前記第1電極における前記半導体部材に対向した角部の曲率半径は、前記第1電極における前記第1配線に対向した角部の曲率半径よりも大きい。【選択図】図4
Bibliography:Application Number: JP20170050087