SPECTRAL FILTER AND SPECTROPHOTOMETRIC DEVICE

PROBLEM TO BE SOLVED: To provide a linear variable spectral filter eliminating a problem of multiple reflections between different filters and having a reduced thickness as a whole.SOLUTION: A spectral filter 10 has a bandpass filter layer 14, a short wavelength cut filter layer 15 and a long wavele...

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Bibliographic Details
Main Authors TAKADA HITOO, NAKATANI TAKAYUKI, KARIYAMA NAOMI
Format Patent
LanguageEnglish
Japanese
Published 04.10.2018
Subjects
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a linear variable spectral filter eliminating a problem of multiple reflections between different filters and having a reduced thickness as a whole.SOLUTION: A spectral filter 10 has a bandpass filter layer 14, a short wavelength cut filter layer 15 and a long wavelength cut filter layer 16 formed on a first surface 12 of a transparent substrate 11. The long wavelength cut filter layer comprises a plurality of base stacks, each base stack composed of a multilayer film stack that blocks light in a given wavelength region. In the plurality of base stacks, a second base stack that blocks light in a region on the longest wavelength side has such a portion where a thickness ratio of the stack to the bandpass filter layer is smaller than the thickness ratio at a first end xA on a shorter wavelength side.SELECTED DRAWING: Figure 1 【課題】異なるフィルタ間の多重反射の問題がなく、かつ全体の厚さを減少させた線形可変分光フィルタを提供する。【解決手段】透明基板１１の第１面１２に形成されたバンドパスフィルタ層１４、短波長カットフィルタ層１５および長波長カットフィルタ層１６を有し、前記長波長カットフィルタ層は、ある波長領域の光を遮断する多層膜スタックを一つの基本スタックとして、複数の基本スタックからなり、前記複数の基本スタックのうち、最も長波長側の領域を遮断する第２基本スタックは、前記バンドパスフィルタ層との厚さ比が短波長側の第１端ｘＡにおける当該厚さ比より小さい部分を有する分光フィルタ１０。【選択図】図１
Bibliography:Application Number: JP20170053492