INSPECTION APPARATUS AND INSPECTION SYSTEM

PROBLEM TO BE SOLVED: To provide an inspection apparatus and an inspection system for suppressing the omission of data relevant to inspection results.SOLUTION: An X-ray inspection apparatus 100 includes an inspection unit 176, an HDD 174, and an inspection control unit 178. The inspection unit 176 i...

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Bibliographic Details
Main Authors ISHIDA TETSUYA, CHIBA TOSHIYUKI, IWAI KOJI
Format Patent
LanguageEnglish
Japanese
Published 23.08.2018
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide an inspection apparatus and an inspection system for suppressing the omission of data relevant to inspection results.SOLUTION: An X-ray inspection apparatus 100 includes an inspection unit 176, an HDD 174, and an inspection control unit 178. The inspection unit 176 inspects articles. The HDD 174 stores data on inspection results by the inspection unit 176. The inspection control unit 178 stops the inspection by the inspection unit 176, when a variable dcap indicating the cumulative capacity of data in the HDD 174 reaches a preset stop threshold Ths.SELECTED DRAWING: Figure 5 【課題】検査結果に関するデータの欠落を抑制する検査装置および検査システムを提供する。【解決手段】Ｘ線検査装置１００は、検査部１７６と、ＨＤＤ１７４と、検査制御部１７８とを備える。検査部１７６は、物品を検査する。ＨＤＤ１７４は、検査部１７６による検査結果に関するデータを記憶する。検査制御部１７８は、ＨＤＤ１７４におけるデータの累積容量を示す変数ｄｃａｐが予め設定されている停止閾値を示す定数Ｔｈｓに到達した場合に、検査部１７６による検査を停止させる。【選択図】図５
Bibliography:Application Number: JP20150124151