SEMICONDUCTOR INSPECTION TOOL

PROBLEM TO BE SOLVED: To provide a semiconductor inspection tool that can have a long life.SOLUTION: Substrates 6a and 6b having conductive patterns 5a and 5b are provided on a base 4 on which a semiconductor device 1 is to be mounted. The conductive patterns 5a and 5b intersect with leads 3a and 3b...

Full description

Saved in:
Bibliographic Details
Main Authors KOYANAGI MOTOYOSHI, KOBAYASHI YUYA, KUBOTA MASAYUKI, TANIUCHI TOMOHITO, KITAGAWA TETSUYA, IKEDA DAISUKE, SASANO KAZUHIRO
Format Patent
LanguageEnglish
Japanese
Published 21.06.2018
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:PROBLEM TO BE SOLVED: To provide a semiconductor inspection tool that can have a long life.SOLUTION: Substrates 6a and 6b having conductive patterns 5a and 5b are provided on a base 4 on which a semiconductor device 1 is to be mounted. The conductive patterns 5a and 5b intersect with leads 3a and 3b from a direction which is not horizontal to the leads 3a and 3b of the semiconductor device 1 on the base 4, and are in contact with the middle part of the leads 3a and 3b without contacting with the ends of the leads 3a and 3b.SELECTED DRAWING: Figure 3 【課題】長寿命化を図ることができる半導体検査治具を得る。【解決手段】半導体装置１を載せるベース４の上に、導電パターン５ａ，５ｂを有する基板６ａ，６ｂが設けられている。導電パターン５ａ，５ｂは、ベース４に載せられた半導体装置１のリード３ａ，３ｂに対して水平方向ではない方向からリード３ａ，３ｂに交差し、リード３ａ，３ｂの先端に接触することなくリード３ａ，３ｂの中間部分に接触する。【選択図】図３
Bibliography:Application Number: JP20160240326