DUAL MODE SMALL ANGLE SCATTERING CAMERA

PROBLEM TO BE SOLVED: To provide a dual mode SAXS camera for analyzing a sample, which offers both a one-dimensional operation mode and a two-dimensional operation mode.SOLUTION: A system for analyzing a sample is provided. The system comprises: an x-ray source 114; an optical system 116 for receivi...

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Bibliographic Details
Main Author JIANG LICAI
Format Patent
LanguageEnglish
Japanese
Published 07.06.2018
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a dual mode SAXS camera for analyzing a sample, which offers both a one-dimensional operation mode and a two-dimensional operation mode.SOLUTION: A system for analyzing a sample is provided. The system comprises: an x-ray source 114; an optical system 116 for receiving x-rays from the X-ray source 114 and providing both a one-dimensional beam and two-dimensional beam onto a sample; a beam selection device 122 for selecting either the one-dimensional beam or the two- dimensional beam; and a detector for collecting scattering data from the sample.SELECTED DRAWING: Figure 1 【課題】１次元動作モード及び２次元動作モード双方を与えることが可能な、試料を分析するデュアルモードＳＡＸＳカメラを提供する。【解決手段】試料を分析するシステムが与えられる。システムは、Ｘ線放射源１１４と、Ｘ線放射源からのＸ線を試料上に１次元ビーム及び２次元ビーム双方を与える光学系１１６と、１次元Ｘ線ビーム又は２次元ビームのいづれかを選択するビーム選択デバイス１２２を備え、試料からの散乱データを収集する検出器を備える。【選択図】図１
Bibliography:Application Number: JP20180014990