CATALYST ANALYZING METHOD

• Main Authors: KONISHI TOMOHIRO, IKEDA RINA, HASHIMOTO MASUMI
• Format: Patent
• Language: English; Japanese
• Published: 10.05.2018
• Subjects: CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOIDCHEMISTRY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PERFORMING OPERATIONS; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL; PHYSICS; TESTING; THEIR RELEVANT APPARATUS; TRANSPORTING

PROBLEM TO BE SOLVED: To provide a catalyst analyzing method that permits accurate analysis of element distribution in catalysts.SOLUTION: A catalyst 2a analyzing method comprises a step of covering the surface of the catalyst 2a containing a porous carrier with a resin film 4, a step of embedding a catalyst 2b covered with the resin film 4 in thermosetting resin to prepare a specimen 8, a step of exposing a cross section 2c of the catalyst 2b by treating the specimen 8 by at least either cutting or grinding, and a step of irradiating the cross section 2c with at least one of electron beams and X rays thereby to detect at least one of the electron beams or the X rays derived from the cross section 2c. The resin film 4 contains at least one of cyanoacrylate or polycyanoacrylate. Alternatively, the resin film 4 may be formed of topcoat agent.SELECTED DRAWING: Figure 2 【課題】触媒における元素分布を正確に分析することができる触媒の分析方法を提供する。【解決手段】触媒２ａの分析方法は、多孔質の担体を含む触媒２ａの表面を、樹脂膜４で覆う工程と、樹脂膜４で覆われた触媒２ｂを熱硬化性樹脂へ包埋して、試料８を調製する工程と、切断又は研磨のうち少なくともいずれかで試料８を処理して、触媒２ｂの断面２ｃを露出させる工程と、電子線又はＸ線のうち少なくともいずれかを断面２ｃへ照射して、断面２ｃに由来する電子又はＸ線のうち少なくともいずかを検出する工程と、を備える。樹脂膜４は、シアノアクリレート及びポリシアノアクリレートのうち少なくともいずれか一つを含む。または、樹脂膜４はトップコート剤から形成される。【選択図】図２