METHOD FOR MEASUREMENT OF VARNISH FILM THICKNESS OF PRINTED MATTER AND VARNISH FILM THICKNESS MEASUREMENT DEVICE

• Main Author: NUMAUCHI HIROMITSU
• Format: Patent
• Language: English; Japanese
• Published: 05.04.2018
• Subjects: COLOUR PRINTING; LINING MACHINES; PERFORMING OPERATIONS; PRINTING; PRINTING MACHINES OR PRESSES; PRINTING, DUPLICATING, MARKING, OR COPYING PROCESSES; STAMPS; TRANSPORTING; TYPEWRITERS

PROBLEM TO BE SOLVED: To provide a method for measurement of a varnish film thickness of a printed matter by which a film thickness of varnish coated on a surface of a printed matter can be correctly measured at a real time, and a varnish film thickness measurement device.SOLUTION: A method for measurement of a varnish film thickness of a printed matter which determines a film thickness of varnish on a sheet 1 in which a pattern is printed by an ink on a substrate and varnish is coated thereon. According to this method, a metal foil 1c having a smooth surface is attached to the substrate of the sheet 1, a film thickness of varnish directly coated on the metal foil 1c is detected by a spectroscopic interference film thickness meter, and a quality of a film thickness of varnish is determined based on the result detected by the spectroscopic interference film thickness meter.SELECTED DRAWING: Figure 2 【課題】印刷物の表面に塗布されたニスの膜厚をリアルタイムで正確に測定することを可能とした印刷物のニス膜厚測定方法及びニス膜厚測定装置を提供する。【解決手段】基体上にインキによって絵柄が印刷され、その上にニスが塗布されたシート１のニスの膜厚を求める印刷物のニス膜厚測定方法として、シート１の基体上に滑らかな表面を有する金属箔１ｃを添付し、金属箔１ｃ上に直接塗布されたニスの膜厚を分光干渉膜厚計で検出し、分光干渉膜厚計で検出した結果に基づいてニスの膜厚の良否を判断するようにした。【選択図】図２