ANALYSIS METHOD, AND SAMPLE SUPPORT FILM AND MANUFACTURING METHOD THEREOF

• Main Authors: ONODERA HIROSHI, KONYUBA YUJI
• Format: Patent
• Language: English; Japanese
• Published: 08.03.2018
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an analysis method capable of obtaining high quantitative accuracy in quantitative analysis of components contained in a liquid sample by fluorescent X-ray spectroscopy.SOLUTION: An analysis method includes: a step of preparing a sample support film 100 including a drop region 2 whose surface has a plurality of recess parts 10; a step of dropping a liquid sample on the drop region 2, so as to dry the sample, and extracting components contained in the liquid sample; and a step of measuring the extracted components by fluorescent X-ray spectroscopy. The depth of each of the recess parts 10 is 10 μm or less.SELECTED DRAWING: Figure 6 【課題】蛍光Ｘ線分析法による液体試料の含有成分の定量分析において、高い定量精度を得ることができる分析方法を提供する。【解決手段】本発明に係る分析方法は、表面に複数の凹部１０が設けられた滴下領域２を有する試料支持フィルム１００を準備する工程と、滴下領域２に液体試料を滴下し乾燥させて、液体試料の含有成分を析出させる工程と、析出した含有成分を蛍光Ｘ線分析法によって測定する工程と、を含み、凹部１０の深さは、１０μｍ以下である。【選択図】図６