TRANSMISSION ELECTRON MICROSCOPE IMAGE SIMULATION METHOD

• Main Authors: SASAKI YUKICHI, KINOSHITA KEISUKE, NAGASHIMA SHINYA, KAWASAKI TADAHIRO, YOSHIDA KANAME
• Format: Patent
• Language: English; Japanese
• Published: 07.12.2017
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY

PROBLEM TO BE SOLVED: To provide a method for highly precisely simulating a transmission electron microscope image of a solid sample present in a phase consisting of a liquid or gas, the transmission electron microscope image being obtained by actual observation.SOLUTION: Assuming that, in a phase consisting of a liquid or gas, the energy loss of an electron beam and the spread in a travelling direction thereof occur, the effects of the energy loss and the spread are individually calculated, and images formed by electrons emitted from a solid sample are superimposed to obtain a synthesized image.SELECTED DRAWING: Figure 2 【課題】液体又は気体からなる相の中に存在する固体試料の実観察で得られる透過電子顕微鏡像を高精度にシミュレーションする方法の提供。【解決手段】液体又は気体からなる相では、電子線のエネルギー損失及び進行方向の広がりが生ずるとし、その効果を個別に計算して固体試料から放出された電子による各結像を重畳し、合成結像を得る。【選択図】図２