LEVEL SHIFTER

PROBLEM TO BE SOLVED: To achieve high reliability.SOLUTION: The level shifter includes: a first circuit which inverts a first signal SE and generates a delayed second signal DEn; a NAND circuit 65 into which the first signal SE and the second signal DEn are input; a first transistor 70 to one end of...

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Bibliographic Details
Main Authors SATO MANABU, BUSHNAQ SANAD SALEH KHAIREDDEEN
Format Patent
LanguageEnglish
Japanese
Published 30.11.2017
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Summary:PROBLEM TO BE SOLVED: To achieve high reliability.SOLUTION: The level shifter includes: a first circuit which inverts a first signal SE and generates a delayed second signal DEn; a NAND circuit 65 into which the first signal SE and the second signal DEn are input; a first transistor 70 to one end of which a first voltage VLS is applied, the other end of which is connected with a power terminal Tsup and into a gate of which a third signal SEn is input; second and third transistors 66 and 67 to one ends of which a second voltage VBST is applied in common, the other ends of which are connected with a first wiring NVTD in common and a gate of which is connected with an output terminal OUT or into a gate of which a first signal SE is input; and a fourth transistor 69 one end of which is connected with a first wiring NVTD, the other of which is connected with an output terminal OUT and into a gate of which an output signal GATEP is input.SELECTED DRAWING: Figure 5 【課題】信頼性を向上する。【解決手段】実施形態に係るレベルシフタは、第1信号SEを反転し且つ遅延させた第2信号DEnを生成する第1回路と、第1信号SE及び第2信号DEnが入力されるNAND回路65と、一端に第1電圧VLSが印加され、他端が電源端子Tsupに接続され、ゲートに第3信号SEnが入力される第1トランジスタ70と、一端に第2電圧VBSTが共通に印加され、他端が第1配線NVTDに共通に接続され、ゲートが出力端子OUTに接続され、あるいはゲートに第1信号SEが入力される第2及び第3トランジスタ66及び67と、一端が第1配線NVTDに接続され、他端が出力端子OUTに接続され、ゲートに出力信号GATEPが入力される第4トランジスタ69と、を含む。【選択図】図5
Bibliography:Application Number: JP20160103566