CURABLE COMPOSITION

PROBLEM TO BE SOLVED: To provide a curable composition for sealing a semiconductor, which hardly causes partial discharge even at a high voltage.SOLUTION: The curable composition contains: a polysiloxane compound having at least two SiH groups in one molecule as a component (A); a polysiloxane compo...

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Bibliographic Details
Main Authors ODAGIRI KEIICHI, SAWAMOTO DAISUKE, SAIKI TOMOAKI, FUKUNAGA HIROYA
Format Patent
LanguageEnglish
Japanese
Published 30.11.2017
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Summary:PROBLEM TO BE SOLVED: To provide a curable composition for sealing a semiconductor, which hardly causes partial discharge even at a high voltage.SOLUTION: The curable composition contains: a polysiloxane compound having at least two SiH groups in one molecule as a component (A); a polysiloxane compound having at least two vinyl groups in one molecule as a component (B); a hydrosilylation catalyst as a component (C); and a polyether-modified polysiloxane compound represented by general formula (1) as a component (D). The content of the component (D) is 0.001-0.25 pt.mass based on 100 pts.mass of the total amount of the component (A) and the component (B).SELECTED DRAWING: None 【課題】高電圧でも部分放電が起こりにくい、半導体封止用の硬化性組成物を提供する。【解決手段】(A)成分として1分子中に少なくとも2つのSiH基を有するポリシロキサン化合物と、(B)成分として1分子中に少なくとも2つのビニル基を有するポリシロキサン化合物と、(C)成分としてヒドロシリル化触媒と、(D)成分として下記一般式(1)で表されるポリエーテル変性ポリシロキサン化合物と、を含有し、(D)成分の含量が、(A)成分と前記(B)成分との合計量100質量部に対して、0.001〜0.25質量部である硬化性組成物である。【選択図】なし
Bibliography:Application Number: JP20160103278