SOLID-STATE LASER AND INSPECTION SYSTEM USING 193-NM LASER

PROBLEM TO BE SOLVED: To provide improved laser systems and associated techniques.SOLUTION: The systems and techniques generate an ultra-violet (UV) wavelength of approximately 193.368 nm from a fundamental vacuum wavelength near 1064 nm. Preferred embodiments separate out (102, 102') an uncons...

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Main Authors FIELDEN JOHN, YUNG-HO ALEX CHUANG, J JOSEPH ARMSTRONG, VLADIMIR DRIBINSKI
Format Patent
LanguageEnglish
Japanese
Published 19.10.2017
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Abstract PROBLEM TO BE SOLVED: To provide improved laser systems and associated techniques.SOLUTION: The systems and techniques generate an ultra-violet (UV) wavelength of approximately 193.368 nm from a fundamental vacuum wavelength near 1064 nm. Preferred embodiments separate out (102, 102') an unconsumed portion of an input wavelength to at least one stage, and redirect (104) that unconsumed portion for use in another stage. The improved laser systems and associated techniques result in less expensive, longer life lasers than those currently being used in the industry.SELECTED DRAWING: Figure 1A 【課題】改良されたレーザーシステムおよび関連する技術を提供する。【解決手段】1064nmに近い基本真空波長から、約193.368nmの紫外線(UV)波長を発生させる。好適な実施形態は、入力波長の未消費の部分を少なくとも一段階に分割し(102, 102′)、別の段階での使用のためにその未消費の部分を向け直す(104)。改良されたレーザーシステムおよび関連する技術は、産業において現在使用されているそれよりも、より安価で、より長寿命のレーザーをもたらす。【選択図】図1A
AbstractList PROBLEM TO BE SOLVED: To provide improved laser systems and associated techniques.SOLUTION: The systems and techniques generate an ultra-violet (UV) wavelength of approximately 193.368 nm from a fundamental vacuum wavelength near 1064 nm. Preferred embodiments separate out (102, 102') an unconsumed portion of an input wavelength to at least one stage, and redirect (104) that unconsumed portion for use in another stage. The improved laser systems and associated techniques result in less expensive, longer life lasers than those currently being used in the industry.SELECTED DRAWING: Figure 1A 【課題】改良されたレーザーシステムおよび関連する技術を提供する。【解決手段】1064nmに近い基本真空波長から、約193.368nmの紫外線(UV)波長を発生させる。好適な実施形態は、入力波長の未消費の部分を少なくとも一段階に分割し(102, 102′)、別の段階での使用のためにその未消費の部分を向け直す(104)。改良されたレーザーシステムおよび関連する技術は、産業において現在使用されているそれよりも、より安価で、より長寿命のレーザーをもたらす。【選択図】図1A
Author YUNG-HO ALEX CHUANG
J JOSEPH ARMSTRONG
VLADIMIR DRIBINSKI
FIELDEN JOHN
Author_xml – fullname: FIELDEN JOHN
– fullname: YUNG-HO ALEX CHUANG
– fullname: J JOSEPH ARMSTRONG
– fullname: VLADIMIR DRIBINSKI
BookMark eNrjYmDJy89L5WSwCvb38XTRDQ5xDHFV8HEMdg1ScPRzUfD0Cw5wdQ7x9PdTCI4MDnH1VQgN9vRzVzC0NNb184Uo5GFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaG5oaWhsZGJo7GRCkCAPSsKuU
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 193nmレーザーを使用する固体レーザーおよび検査システム
ExternalDocumentID JP2017191324A
GroupedDBID EVB
ID FETCH-epo_espacenet_JP2017191324A3
IEDL.DBID EVB
IngestDate Fri Jul 19 14:53:16 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JP2017191324A3
Notes Application Number: JP20170109074
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171019&DB=EPODOC&CC=JP&NR=2017191324A
ParticipantIDs epo_espacenet_JP2017191324A
PublicationCentury 2000
PublicationDate 20171019
PublicationDateYYYYMMDD 2017-10-19
PublicationDate_xml – month: 10
  year: 2017
  text: 20171019
  day: 19
PublicationDecade 2010
PublicationYear 2017
RelatedCompanies KLA-ENCOR CORP
RelatedCompanies_xml – name: KLA-ENCOR CORP
Score 3.2332666
Snippet PROBLEM TO BE SOLVED: To provide improved laser systems and associated techniques.SOLUTION: The systems and techniques generate an ultra-violet (UV) wavelength...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING
DEVICES USING STIMULATED EMISSION
ELECTRICITY
FREQUENCY-CHANGING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
NON-LINEAR OPTICS
OPTICAL ANALOGUE/DIGITAL CONVERTERS
OPTICAL LOGIC ELEMENTS
OPTICS
PHYSICS
TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
TESTING
Title SOLID-STATE LASER AND INSPECTION SYSTEM USING 193-NM LASER
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171019&DB=EPODOC&locale=&CC=JP&NR=2017191324A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3fT8IwEL4g_nzTqVFR0xizt0ah22AmixlbJxI2FjYNPpEVRqImQGTGf99rAeWJx16bpm1yvfva7-4AbkdZVkc7ck8za2xQgwmTZmZ9RBs5Y5nJjNwSMjg5jKzWi9Hum_0SfK5iYVSe0B-VHBE1aoj6Xqj7evb_iOUrbuX8TryjaPoYpI6vL9FxFe0laqDfdHjc9bue7nlOO9aj3qLPRuhluFuwLf1omWifvzZlWMps3aYEh7AT43ST4ghKH5kG-96q9JoGe-Hyx1uDXUXRHM5RuFTD-TE8JN3Os0-T1E056bgJ7xE38gkC8ZgrUghJ3pKUh0QW1Xgi6D3RKFwMPIGbgKdei-JyBn-bH7TjtaWzUyhPppP8DEiNDW3RkCwliW4R5dUNE4EueiMjS1Rr43OobJjoYmNvBQ5kS17RVfsSysXXd36FtrcQ1-rMfgFMyYA1
link.rule.ids 230,309,786,891,25594,76903
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1ZT8JAEJ4gHvimVaPisTGGt41CLzBpTOlhqW1paDX41LRQEjUBYmv8-84uoDzxOrOZzG4yx7c7MwtwO05TFePIPU2ViUQlMZNpKqtj2s5FMZVFKVcy1pzsB4rzIrlDeViBz1UvDJ8T-sOHI6JFjdDeS-6v5_-XWCavrSzusnckzR7tWDMbS3TcxHiJFmh2NSvsm32jYRiaGzaCwYLXQegl6VuwrSIm5FjptcvaUubrMcU-gJ0QxU3LQ6h8pALUjNXXawLs-csXbwF2eYnmqEDi0gyLI3iI-l7PpFGsxxbx9MgaED0wCQLx0OJFISR6i2LLJ-xTjSeC2RMN_MXCY7ixrdhwKKqT_G0-ccM11cUTqE5n0_wUSEscdbI2q1Ji6BZRnirJCHQxGxkrWbM1OYP6BkHnG7nXUHNi30u8XvBch33GYe662bmAavn1nV9iHC6zK35-v3A_gx8
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SOLID-STATE+LASER+AND+INSPECTION+SYSTEM+USING+193-NM+LASER&rft.inventor=FIELDEN+JOHN&rft.inventor=YUNG-HO+ALEX+CHUANG&rft.inventor=J+JOSEPH+ARMSTRONG&rft.inventor=VLADIMIR+DRIBINSKI&rft.date=2017-10-19&rft.externalDBID=A&rft.externalDocID=JP2017191324A