DEVICE AND METHOD FOR FOREIGN MATTER INSPECTION

• Main Authors: TAMAKUNI HISASHI, KUBOTA TSUTOMU
• Format: Patent
• Language: English; Japanese
• Published: 19.10.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a foreign matter inspection device and method, which enable accurate and efficient detection of foreign matter.SOLUTION: The present invention relates to a foreign matter inspection device 10 designed to determine the presence/absence of foreign matter inside a semi-transparent resin container 11, the device comprising an illumination unit 12 configured to irradiate a target section of the container 11 with an infrared ray from outside on one side, and an image capturing unit 13 configured to capture an image of the target section of the container 11 being irradiated by the illumination unit 12 from outside on the other side. The infrared ray preferably has a wavelength in a range of 750-1700 nm.SELECTED DRAWING: Figure 1 【課題】精度良く且つ効率良く異物を検出することのできる異物検査装置及び異物検査方法を提供する。【解決手段】本発明は、半透明な樹脂容器１１の内部における異物の有無を検査する異物検査装置１０であって、容器１１の検査対象部に対して外部一方側から赤外線を照射する照明装置１２と、照明装置１２によって照射された容器１１の検査対象部の外部他方側から画像を撮影する撮像装置１３と、を備えていることを特徴とし、前記赤外線は、７５０ｎｍ〜１７００ｎｍの範囲の波長であることが好ましい。【選択図】図１