ABNORMALITY DIAGNOSIS METHOD, ABNORMALITY DIAGNOSIS DEVICE AND ABNORMALITY DIAGNOSIS PROGRAM

• Main Authors: NICOLAS SCHMIT, SUZUKI YU, MIZOUCHI KENTARO, KONO YUKIHIRO
• Format: Patent
• Language: English; Japanese
• Published: 05.10.2017
• Subjects: CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MEASURING; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

PROBLEM TO BE SOLVED: To provide an abnormality diagnosis method, an abnormality diagnosis device and an abnormality diagnosis program with which it is possible to specify an abnormal item and specify the type of abnormality.SOLUTION: The abnormality diagnosis method comprises: a step S31 for acquiring diagnosis data that includes values to be diagnosed each corresponding to a plurality of items; a step S35 for determining single abnormality, on the basis of each of the values to be diagnosed, as to whether or not an item corresponding to the value is single abnormality; and a step S36 for determining correlation abnormality, on the basis of a first value to be diagnosed that corresponds to a first item among a plurality of items, a second value to be diagnosed that corresponds to a second item, and a correlation coefficient indicating the strength of correlation of the first item and the second item, as to whether or not the first item and the second item have correlation abnormality.SELECTED DRAWING: Figure 6 【課題】異常な項目を特定するとともに、異常の種類を特定することが可能な異常診断方法、異常診断装置、及び異常診断プログラムを提供する。【解決手段】異常診断方法は、複数の項目にそれぞれ対応した診断対象の値を含む診断データを取得するステップＳ３１と、診断対象の値のそれぞれに基づいて、当該値に対応する項目が単独異常か否かの単独異常判定を行うステップＳ３５と、複数の項目のうちの第１項目に対応した診断対象の値である第１値と、第２項目に対応した診断対象の値である第２値と、第１項目及び第２項目の相関の強さを示す相関係数と、に基づいて、第１項目及び第２項目が相関異常であるか否かの相関異常判定を行うステップＳ３６と、を備える。【選択図】図６