SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To form regions of different carrier concentration easily on a semiconductor substrate.SOLUTION: On the surface of a first conductivity type semiconductor substrate 1, doped regions 41, 42 are formed by selectively doping with second conductivity type impurities. Surface of the...

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Bibliographic Details
Main Authors KATANO TOMONORI, IMAI FUMIKAZU
Format Patent
LanguageEnglish
Japanese
Published 21.09.2017
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Summary:PROBLEM TO BE SOLVED: To form regions of different carrier concentration easily on a semiconductor substrate.SOLUTION: On the surface of a first conductivity type semiconductor substrate 1, doped regions 41, 42 are formed by selectively doping with second conductivity type impurities. Surface of the doped regions 41, 42 is partially coated with a heat insulation film 7, and at least the reminder of the surface of the doped regions 41, 42 is coated with an absorption film 82. Thereafter, the doped regions 41, 42 are heated via the absorption film 82, thus forming more than one doped regions 41, 42 where the second conductivity type impurity regions have the same impurity concentration, and carrier concentrations different from each other.SELECTED DRAWING: Figure 2 【課題】半導体基板上にキャリア濃度が異なる領域を容易に形成できること。【解決手段】第1導電型の半導体基板1の表面に、第2導電型の不純物を選択的にドープしてドープ領域41,42を形成し、ドープ領域41,42の表面の一部を断熱膜7で被覆し、少なくともドープ領域の表面の残りを吸収膜82で被覆し、吸収膜82を介してドープ領域41,42を加熱することで、第2導電型の不純物領域が同じ不純物濃度でキャリア濃度が互いに異なる2つ以上のドープ領域41,42を形成できる。【選択図】図2
Bibliography:Application Number: JP20160053127