APPARATUS AND METHOD FOR INSPECTING FILM

• Main Authors: TAKENAKA YASUSHI, SAWAI TAIKI
• Format: Patent
• Language: English; Japanese
• Published: 03.08.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an apparatus and method for inspecting a film, capable of solving that a high level is required even in the accuracy of film according to a high value added to film application, and the inspection of small irregularities, etc., extremely shallowly deformed is required.SOLUTION: The apparatus for inspecting a film comprises: a light source; a circular iris for removing the scattered light component of light emitted from the light source; a convex lens having a thickness, a plate shape and a convex side surface and for forming light passing through the circular iris into parallel light; a convex lens placed to face a lens having the same shape as the convex lens to condense the light; a knife edge for removing the scattered light component at a focal position of the condensed light; and an imaging lens for imaging the condensed light. A film to be inspected passes the parallel light to be inspected.SELECTED DRAWING: Figure 1 【課題】 フィルムの用途が高付加価値化するに伴い、フィルムの精度にも高いレベルが要求され、非常に浅く変形した小さな凹凸等の検査が必要とされていることから、フィルムの検査装置及び検査方法を提供する。【解決手段】 本発明は、光源と、前記光源から発せられた光の散乱光成分を除去する円形絞りと、前記円形絞りを通過した光を平行光にする厚みを有する板状で側面が凸状の凸レンズと、前記凸レンズと同一形状のレンズを対向するように設置し光を集光する凸レンズと、集光した光の焦点位置に散乱光成分を除去するナイフエッジと、前記集光した光を撮像する撮像レンズとを設け、前記平行光に検査対象であるフィルムを通過させ検査するフィルム検査装置とした。【選択図】 図１