SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To improve reliability of a semiconductor device by suppressing erroneous operation of a semiconductor device.SOLUTION: A semiconductor device according to one embodiment includes each of a plurality of active barrier parts (ABU 1, ABU 2) involved in each of a plurality of elem...

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Bibliographic Details
Main Author FURUYA KEIICHI
Format Patent
LanguageEnglish
Japanese
Published 06.07.2017
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Summary:PROBLEM TO BE SOLVED: To improve reliability of a semiconductor device by suppressing erroneous operation of a semiconductor device.SOLUTION: A semiconductor device according to one embodiment includes each of a plurality of active barrier parts (ABU 1, ABU 2) involved in each of a plurality of element isolation parts (IU1, IU2) constituted from the closed pattern, respectively. That is, each of the plurality of active barrier parts (ABU 1, ABU 2) is electrically separated from each other.SELECTED DRAWING: Figure 4 【課題】半導体装置の誤動作を抑制することによって、半導体装置の信頼性を向上する。【解決手段】一実施の形態における半導体装置は、それぞれ閉じたパターンから構成された複数の素子分離部（ＩＵ１、ＩＵ２）のそれぞれに内包された複数のアクティブバリア部（ＡＢＵ１、ＡＢＵ２）のそれぞれを備える。すなわち、複数のアクティブバリア部（ＡＢＵ１、ＡＢＵ２）のそれぞれは、互いに電気的に分離されている。【選択図】図４
Bibliography:Application Number: JP20150256420