ASSEMBLED CONDITION DIAGNOSIS DEVICE

• Main Authors: GOKO MICHIHISA, SAKAIDA ATSUSUKE, TANIGUCHI TOSHIHISA, SHIRAISHI YOSHIHIKO, OKAMOTO KEIJI
• Format: Patent
• Language: English; Japanese
• Published: 25.05.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

PROBLEM TO BE SOLVED: To provide an assembled condition diagnosis device capable of diagnosing whether assembled condition of assembly parts is appropriate or not.SOLUTION: A diagnosis device 1 is designed to diagnose assembled condition of assembly parts having sliding portions. The diagnosis devic...