MEASUREMENT CELL

PROBLEM TO BE SOLVED: To provide a measurement cell for which in situ analysis is possible in a wide temperature range from low to high temperature.SOLUTION: A measurement cell (1) includes a Peltier element (4) that is disposed on at least one principal surface of a laminate cell (2) and adjusts te...

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Bibliographic Details
Main Authors SUEHIRO SHOGO, FUKUMITSU HITOSHI, TAKAHASHI TERUO, AZUMA YOSUKE
Format Patent
LanguageEnglish
Japanese
Published 25.05.2017
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a measurement cell for which in situ analysis is possible in a wide temperature range from low to high temperature.SOLUTION: A measurement cell (1) includes a Peltier element (4) that is disposed on at least one principal surface of a laminate cell (2) and adjusts temperature thereof. In the Peltier element (4), at least one opening (7b) for making the laminate cell (2) penetrate light is formed.SELECTED DRAWING: Figure 1 【課題】低温から高温までの広い温度範囲でin situ分析可能な測定セルを提供する。【解決手段】測定セル（１）は、ラミネートセル（２）の少なくとも一方の主面に配設され、ラミネートセル（２）の温度を調整するためのペルチェ素子（４）を備え、ペルチェ素子（４）には、ラミネートセル（２）に光を透過させるための開口部（７ｂ）が少なくとも１つ形成されている。【選択図】図１
Bibliography:Application Number: JP20150220650