ANALYSIS METHOD BY MICROSCOPIC RAMAN SPECTROSCOPIC ANALYSIS DEVICE

• Main Authors: MURANAKA TOSHIYUKI, MURAKAMI MASASHI, YANASE YOSHIO, MIYAHARA TAKAHIRO
• Format: Patent
• Language: English; Japanese
• Published: 18.05.2017
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; SEMICONDUCTOR DEVICES; TESTING

PROBLEM TO BE SOLVED: To provide novel means capable of improving the sensitivity of a Raman spectroscopic analysis using a microscopic Raman spectroscopic analysis device.SOLUTION: The present invention provides a method that uses a microscopic Raman spectroscopic analysis device to analyze a sample on a loading surface. The microscopic Raman spectroscopic analysis device includes: a light source; and an objective lens system that converges light emitted from the light source. The method includes: irradiating an analysis object sample disposed at a non-focus position of the objective lens system with the light converged by the objective lens system; and analyzing the analysis object sample on the basis of Raman scattered light obtained from the analysis object sample irradiated with the light.SELECTED DRAWING: None 【課題】顕微ラマン分光分析装置を用いるラマン分光分析の高感度化を可能にするための新たな手段を提供すること【解決手段】顕微ラマン分光分析装置を用いて載置面上の試料を分析する方法。前記顕微ラマン分光分析装置は、光源と、該光源から出射された光を集光する対物レンズ系と、を有し、前記対物レンズ系により集光された光を、前記対物レンズ系の非焦点位置に配置された分析対象試料に照射すること、および、前記光が照射された分析対象試料から得られたラマン散乱光に基づき前記分析対象試料を分析すること、を含む。【選択図】なし