SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING SYSTEM

PROBLEM TO BE SOLVED: To provide a substrate processing method and a substrate processing system which enables the effective recovery and recycling of an etching process liquid even when the concentration of a substrate component is high in the etching process liquid after use.SOLUTION: A substrate...

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Bibliographic Details
Main Authors MATSUI EMI, HAYASHI KONOSUKE
Format Patent
LanguageEnglish
Japanese
Published 20.04.2017
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Summary:PROBLEM TO BE SOLVED: To provide a substrate processing method and a substrate processing system which enables the effective recovery and recycling of an etching process liquid even when the concentration of a substrate component is high in the etching process liquid after use.SOLUTION: A substrate processing method comprises: a process liquid-recovering step for recovering a used etching process liquid used in a process for etching a substrate in a substrate-processing mechanism; a process liquid feedback step for feeding the used etching process liquid thus recovered back to the substrate-processing mechanism as a new etching process liquid; and a substrate component-removing step for removing a component of the substrate in the used etching process liquid before feeding the recovered used etching process liquid back to the substrate-processing mechanism.SELECTED DRAWING: Figure 6 【課題】使用後のエッチング処理液中に基板成分の濃度が高くなっても、エッチング処理液の有効な回収再利用が可能となる基板処理方法及び基板処理システムを提供するものである。【解決手段】基板処理機構において基板のエッチング処理に用いられた使用後エッチング処理液を回収する処理液回収ステップと、回収された前記使用後エッチング処理液を前記基板処理機構に新たなエッチング処理液として戻す処理液戻しステップと、回収された前記使用後エッチング処理液を前記基板処理機構に戻す前に、前記使用後エッチング処理液中にある前記基板の成分を除去する基板成分除去ステップとを有する構成となる。【選択図】図6
Bibliography:Application Number: JP20170009721