METHOD OF ANALYZING ORGANIC SAMPLES

• Main Authors: SUEHIRO SHOGO, YAMAUCHI DAISUKE, TAKAHASHI EIJI, IMANISHI KATSUYA
• Format: Patent
• Language: English; Japanese
• Published: 13.04.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an analysis method that allows for analyzing an element composition ratio, molecular orientation, oxidation/deterioration state, and the like of an organic sample at nanometers from a surface thereof in a depth direction.SOLUTION: A method includes; a step for cutting a recess having a bottom surface with an area no less than 10000 μmand no greater than 25 mm, and a depth of 500 nm or less on a surface of an organic sample to produce an analysis sample; and a measurement step for irradiating the bottom surface of the recess of the produced analysis sample with X-rays and measuring current flowing through the analysis sample.SELECTED DRAWING: Figure 3 【課題】有機物試料の表面からｎｍレベルの深さ方向に対する成分組成比、分子配向性、酸化・劣化状態等を分析することができる分析方法を提供する。【解決手段】有機物試料の表面を、凹部底面の面積が１００００μｍ２以上２５ｍｍ２以下、凹部の深さが５００ｎｍ以下となるように削ることにより分析用試料を作製する工程と、作製された分析用試料の凹部底面にＸ線を照射して、分析用試料に流れる電流を計測する計測工程とを含む。【選択図】図３