DISTORTION DETECTOR AND METHOD, AND MONITORING SYSTEM OF PLANT EQUIPMENT

• Main Authors: IWATA TOMOKAZU, TSUMURA YASUHIRO, TOYOSHIMA KEISEI, MUROYA ITARU
• Format: Patent
• Language: English; Japanese
• Published: 13.04.2017
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

PROBLEM TO BE SOLVED: To provide a distortion detector and a method, and a monitoring system of plant equipment capable of easily detecting distortion and improving detection accuracy.SOLUTION: The distortion detector includes: an artificial opal thin film (colloidal crystal film) 21 attachable to the surface on a detection object; and a deflection filter 22, which is formed over the surface of the artificial opal thin film 21, to allow a beam of reflected light having a predetermined wavelength to transmit therethrough.SELECTED DRAWING: Figure 3 【課題】ひずみ検出器及び方法並びにプラント機器のモニタリングシステムにおいて、ひずみを容易に検出することで検出精度の向上を図る。【解決手段】検出対象物の表面に装着可能な人工オパール薄膜（コロイド結晶膜）２１と、人工オパール薄膜２１の表面に設けられて予め設定された所定波長の反射光を透過させる偏向フィルタ２２とを設ける。【選択図】図３