MEMORY SYSTEM

PROBLEM TO BE SOLVED: To provide a memory system capable of improving operation reliability.SOLUTION: A memory system includes a controller and a semiconductor memory device. In a first mode (ZN0 is selected in PPP mode), data is written in a first column group ZN0. In a second mode (ZN3 is selected...

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Bibliographic Details
Main Authors YASUFUKU KENTA, SHIRAKAWA MASANOBU, YAMAYA AKIRA
Format Patent
LanguageEnglish
Japanese
Published 16.03.2017
Subjects
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Summary:PROBLEM TO BE SOLVED: To provide a memory system capable of improving operation reliability.SOLUTION: A memory system includes a controller and a semiconductor memory device. In a first mode (ZN0 is selected in PPP mode), data is written in a first column group ZN0. In a second mode (ZN3 is selected in PPP mode), data is written in a second column group ZN3. The semiconductor memory device uses a first setting value in the first mode (where ZN0 is selected) as an operation setting value in a write operation; and in a second mode (where ZN3 is selected), uses a second setting value different from the first setting value.SELECTED DRAWING: Figure 6 【課題】動作信頼性を向上出来るメモリシステムを提供する。【解決手段】一実施形態のメモリシステムは、コントローラと、半導体記憶装置とを具備する。第１モード(PPP modeのZN0選択)では、第１カラム群ZN0にデータが書き込まれる。第２モード(PPP modeのZN3選択)では、第２カラム群ZN3にデータが書き込まれる。半導体記憶装置は書き込み動作における動作設定値につき、第１モード(ZN0選択時)では第１設定値を用い、第２モード(ZN3選択時)では前記第１設定値と異なる第２設定値を用いる。【選択図】図６
Bibliography:Application Number: JP20150179942