MEASUREMENT DEVICE AND MEASUREMENT METHOD

• Main Authors: TOKIMITSU TAKUMI, KITAMURA TSUTOMU
• Format: Patent
• Language: English; Japanese
• Published: 09.02.2017
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a measurement device that is advantageous to measurement accuracy.SOLUTION: A measurement device 1 measuring a shape of a measured workpiece 5 includes: a projection unit 2 that has a bright part and dark part alternatively arranged, includes an identification unit i...