SEMICONDUCTOR DEVICE AND CONTROL METHOD THEREOF
PROBLEM TO BE SOLVED: To provide a semiconductor device and a control method thereof, capable of executing a wanted process without omitting a process of low priority.SOLUTION: According to one embodiment, a re-configurable device 1 includes a configuration information storing memory 12 for storing...
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Main Authors | , , , |
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Format | Patent |
Language | English Japanese |
Published |
12.01.2017
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide a semiconductor device and a control method thereof, capable of executing a wanted process without omitting a process of low priority.SOLUTION: According to one embodiment, a re-configurable device 1 includes a configuration information storing memory 12 for storing a plurality of pieces of configuration information, a state transition management unit 11 for selecting any of the plurality of pieces of configuration information, and a data path unit 13 which dynamically re-configures a circuit on the basis of the configuration information that is selected by the state transition management unit 11. The state transition management unit 11, in a case where no failure is detected at any of tiles T1 and T2 provided at the data path unit 13, selects configuration information so that a first process circuit is configured using the tiles T1 and T2, and when a failure is detected with the tile T2, selects configuration information and constitutes a first intermediate processing circuit by using the tile T1 for which no failure is detected, and then, uses the tile T1 again to constitute a second intermediate processing circuit, realizing the first processing circuit.SELECTED DRAWING: Figure 4
【課題】優先度の低い処理を省略することなく所望の処理を実行することが可能な半導体装置及びその制御方法を提供すること。【解決手段】一実施の形態によれば、再構成可能デバイス1は、複数の構成情報を格納する構成情報格納メモリ12と、複数の構成情報のうちの何れかを選択する状態遷移管理部11と、状態遷移管理部11によって選択された構成情報に基づいて動的に回路を再構成するデータパス部13と、を備え、状態遷移管理部11は、データパス部13に設けられたタイルT1,T2の何れにも故障が検出されない場合、タイルT1,T2を用いて第1処理回路が構成されるように構成情報を選択し、タイルT2に故障が検出された場合、故障が検出されていないタイルT1を用いて第1中間処理回路を構成した後、再びタイルT1を用いて第2中間処理回路を構成することで、第1処理回路が実現されるように構成情報を選択する。【選択図】図4 |
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Bibliography: | Application Number: JP20150123432 |