LEARNING SUPPORT DEVICE

• Main Authors: IWASAKI AKINORI, FUKUDA ERI, HASHIMOTO SHINICHI, EBARA SATOKO, NITTA HARUHIKO, KIDO KAZUHIKO, OKAZAKI HIRONOBU, INAGAWA KEISUKE, WATANABE KANJI
• Format: Patent
• Language: English; Japanese
• Published: 05.01.2017
• Subjects: ADVERTISING; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND,DEAF OR MUTE; CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; CRYPTOGRAPHY; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES; DIAGRAMS; DISPLAY; EDUCATION; EDUCATIONAL OR DEMONSTRATION APPLIANCES; GLOBES; PHYSICS; PLANETARIA; SEALS; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR

PROBLEM TO BE SOLVED: To provide a learning support device that presents to a learner his or her future learning achievements foreseen from the past learning achievements of the same learner and enables his or her learning efforts to be evaluated by comparison with actual achievements.SOLUTION: Many English vocabulary questions and a correct answer to each are accumulated in a vocabulary question/correct answer storage unit 2. When a learner takes a test starting action, a learning processor 7 chooses 10 questions at random from the vocabulary question/correct answer storage unit 2 to prepare one set of vocabulary questions and displays them on a display unit 3. When answers are inputted and graded, the results are displayed and stored into a learning achievement history memory 5. When more than four tests have been given, the coupling coefficient of the neural network part of a learning achievement predictor 6 is caused to be modified by using the latest four learning achievements. When the prediction error falls to or below a certain level, thereafter the learning achievement for the next test is caused to be predicted every time the learning achievement for a vocabulary test is graded, stored into the learning achievement history memory 5 and displayed together with the actual learning achievement at the time of execution of the next test.SELECTED DRAWING: Figure 1 【課題】過去の学習成績から未来の学習成績を予測し学習者に提示し、実際の成績との対比により学習努力を評価可能とした学習支援装置を提供する。【解決手段】語彙問題・正解蓄積部２に英語の多数の語彙問題と正解を蓄積しておく。学習者がテスト開始操作をすると学習処理部７は、語彙問題・正解蓄積部２からランダムに１０問選択して１回分の語彙テストを作成し、表示部３に表示し、解答入力すると、採点して成績を表示し、学習成績履歴記憶部５に記憶させる。４回目以降のテストがされたとき、最新の４回分の学習成績を用いて学習成績予測部６のニューラルネットワーク部の結合係数を修正させる。予測誤差が一定以下になれば、以降、語彙テストの学習成績を採点する度に次のテストの学習成績を予測させて学習成績履歴記憶部５に記憶させ、次のテストの実行時に実際の学習成績とともに表示する。【選択図】図１