SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method and a semiconductor device, which can form a narrow mesa stripe and furthermore prevent a substrate from cracking around grooves on both sides of the mesa stripe.SOLUTION: A semiconductor device manufacturing method compris...

Full description

Saved in:
Bibliographic Details
Main Author SAKUMA HITOSHI
Format Patent
LanguageEnglish
Japanese
Published 15.12.2016
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method and a semiconductor device, which can form a narrow mesa stripe and furthermore prevent a substrate from cracking around grooves on both sides of the mesa stripe.SOLUTION: A semiconductor device manufacturing method comprises: a process of forming on a semiconductor substrate, a mesa stripe including an active layer and a semiconductor layer which covers the mesa stripe; a process of forming on the semiconductor layer, a mask pattern for exposing the semiconductor layer on both sides of the mesa stripe; an isotropic etching process of performing isotropic etching on the semiconductor layer exposed from the mask pattern to form a depression with an arc-like cross-sectional shape in the semiconductor layer; and an anisotropic etching process of performing anisotropic etching on the semiconductor layer exposed from the mask pattern after the isotropic etching process to continue etching to a semiconductor substrate.SELECTED DRAWING: Figure 1 【課題】本発明は、幅の狭いメサストライプを形成でき、しかもメサストライプの左右の溝の周辺で基板が割れることを防止できる半導体装置の製造方法と半導体装置を提供することを目的とする。【解決手段】半導体基板の上に、活性層を含むメサストライプと、該メサストライプを覆う半導体層と、を形成する工程と、該半導体層の上に、該メサストライプの左右の該半導体層を露出させるマスクパターンを形成する工程と、該マスクパターンから露出した該半導体層に等方性エッチングを施し、該半導体層に断面形状が円弧状のくぼみを形成する等方性エッチング工程と、該等方性エッチング工程の後に、該マスクパターンから露出した該半導体層に異方性エッチングを施し、該半導体基板までエッチングを進める異方性エッチング工程と、を備える。【選択図】図1
Bibliography:Application Number: JP20150095800