MEASUREMENT SYSTEM

• Main Authors: ABE YUICHI, NAGATOMO WATARU
• Format: Patent
• Language: English; Japanese
• Published: 29.09.2016
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a measurement system capable of easily reusing an identification surface which has been used in previous pattern matching.SOLUTION: The measurement system has a storage for storing a matching identification surface for determining whether a matching has been made successfully and an algorithm identification surface for selecting an algorithm while giving a piece of unique identification information to at least either one. The identification surface is called out by using the identification information as a key.SELECTED DRAWING: Figure 1 【課題】過去にパターンマッチングを実施した際に使用した識別面を容易に再利用することができる計測装置を提供する。【解決手段】本発明に係る計測装置は、マッチング成否を判定するためのマッチング識別面と、アルゴリズムを選択するためのアルゴリズム識別面とのうち少なくともいずれかについて、固有の識別情報を付与して記憶部に格納しておき、識別情報をキーにしてこれら識別面を呼び出す。【選択図】図１