TITANIUM COPPER FOR ELECTRONIC COMPONENT

PROBLEM TO BE SOLVED: To provide an excellent balance of strength and ductility to a titanium copper by controlling a grain boundary reaction phase.SOLUTION: There is provided titanium copper for electronic component containing Ti of 2.0 to 4.0 mass%, one or more kind selected from a group consistin...

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Bibliographic Details
Main Author HORIE HIROYASU
Format Patent
LanguageEnglish
Japanese
Published 12.08.2016
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Summary:PROBLEM TO BE SOLVED: To provide an excellent balance of strength and ductility to a titanium copper by controlling a grain boundary reaction phase.SOLUTION: There is provided titanium copper for electronic component containing Ti of 2.0 to 4.0 mass%, one or more kind selected from a group consisting of Fe, Co, Mg, Si, Ni, Cr, Zr, Mo, V, Nb, Mn, B, and P as a third element of total 0 to 0.5 mass%, and the balance copper with inevitable impurities and having percentage of length of a grain boundary reaction phase occupying a grain boundary to the total grain boundary length of 5 to 40% in a structure observation of a cross section parallel to a rolling direction and average value of aspect ratio of the grain boundary reaction phase represented by b/a of 0.1 to 0.8, where a is length along with the grain boundary for each grain boundary reaction phase and b is length in a direction into a grain.SELECTED DRAWING: Figure 1 【課題】粒界反応相の制御によってチタン銅に対する強度と延性の優れたバランスを得る。【解決手段】Tiを2.0〜4.0質量%含有し、第三元素としてFe、Co、Mg、Si、Ni、Cr、Zr、Mo、V、Nb、Mn、B、及びPからなる群から選択された1種以上を合計で0〜0.5質量%含有し、残部が銅及び不可避的不純物からなる電子部品用チタン銅であって、圧延方向に平行な断面の組織観察において、全粒界長さに対して粒界反応相が粒界を占める長さの割合が5〜40%であり、且つ、個々の粒界反応相について粒界に沿った長さをaとし、粒内方向への長さをbとして、b/aで表される粒界反応相のアスペクト比の平均値が0.1〜0.8であるチタン銅。【選択図】図1
Bibliography:Application Number: JP20160051588