THREE-DIMENSIONAL MOLDING APPARATUS AND THREE-DIMENSIONAL MOLDING METHOD
PROBLEM TO BE SOLVED: To form a three-dimensional molded object with high accuracy by considering variations in thickness of materials and dimensional changes by heating.SOLUTION: A three-dimensional molding apparatus is provided, which includes: varying means capable of varying a relative position...
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Main Author | |
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Format | Patent |
Language | English Japanese |
Published |
25.07.2016
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To form a three-dimensional molded object with high accuracy by considering variations in thickness of materials and dimensional changes by heating.SOLUTION: A three-dimensional molding apparatus is provided, which includes: varying means capable of varying a relative position of a stage with respect to a heating section in a stacking direction of constituent layers; first measuring means for measuring a thickness of a constituent layer in the stacking direction prior to stacking; second measuring means for measuring a thickness of a stacked molded object stacked on the stage; and control means described below. The control means controls the varying means in such a manner that the thickness of the stacked molded object after a target constituent layer is stacked is coincident with or close to a target thickness value of a stacked molded object individually set to respond to the number of stacked layers, by using a first measurement value of the thickness of the target constituent layer measured by the first measuring means and using a second measurement value of the thickness of the stacked molded object before the target constituent layer is stacked measured by the second measuring means, and then adjusts a relative position of the stage with respect to the heating section upon stacking the target constituent layer.SELECTED DRAWING: Figure 1
【課題】材料の厚さのばらつき、加熱による寸法変化を考慮して、精度よく立体造形物を形成する。【解決手段】加熱部に対するステージの相対位置を対応層の積層方向で変更可能な変更手段と、積層前の対応層の積層方向の厚さを測定する第1測定手段と、ステージ上に積層された積層造形物の積層方向の厚さを測定する第2測定手段と、第1測定手段により測定された注目対応層の厚さの第1測定値と、第2測定手段により測定された、注目対応層を積層する前の積層造形物の厚さの第2測定値と、を用いて、注目対応層を積層した積層造形物の厚さが、積層数に対応してそれぞれ設定されている積層造形物の厚さの目標値に一致するか又は近付くように、変更手段を制御して、注目対応層を積層するときの、加熱部に対するステージの相対位置を調整する制御手段と、を備える。【選択図】図1 |
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Bibliography: | Application Number: JP20150009797 |