INTERACTION ANALYZER

• Main Authors: OBARA TAKAYUKI, TAKAHASHI SATOSHI, KUMAZAKI NOBUTAKA
• Format: Patent
• Language: English; Japanese
• Published: 30.06.2016
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide an interaction analyzer that can automate fixing of a measurement sample to a measurement substrate and allows a worker to freely control the amount of the measurement sample at the observation.SOLUTION: The interaction analyzer includes: a substrate; a liquid-sending mechanism for sending a measurement sample and a reaction reagent to the substrate; an observation mechanism for observing the measurement sample on the substrate; an analyzing mechanism for analyzing the amount of the measurement sample fixed on the substrate based on the observation result obtained by the observation mechanism; and a control mechanism for adjusting the amount of the measurement sample fixed on the substrate. The interaction analyzer fixes the measurement sample on a surface of the substrate, measures the amount of the measurement sample fixed on the substrate surface, and adjusts the amount of the measurement sample fixed to the substrate based on the measurement result.SELECTED DRAWING: Figure 1 【課題】測定基板に対する測定試料の固定を自動化し、かつ観察時における測定試料の量を、作業者が任意に制御することのできる、相互作用解析装置を提供する。【解決手段】基板と、前記基板に測定試料および反応試薬を提供するための送液機構と、前記基板表面の測定試料を観察するための観察機構と、前記観察機構の観察結果をもとに、前記測定基板上における前記測定試料の固定量を解析する解析機構と、前記基板に対する前記測定試料の固定量を調整する制御機構を有することを特徴とする相互作用解析装置であって、基板表面に前記測定試料を固定し、前記基板表面に固定された前記測定試料の固定量を測定し、前記測定結果をもとに前記基板に対する前記測定試料の固定量を調節することを特徴とする。【選択図】 図１