MANUFACTURE METHOD OF LIGHT-EMITTING DEVICE

PROBLEM TO BE SOLVED: To provide an inexpensive semiconductor device by realizing a further low temperature process (350°C or less, preferably, 300°C or less).SOLUTION: After forming a semiconductor layer 103 having crystalline structure, a p-type impurity element and a hydrogen element are added si...

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Bibliographic Details
Main Authors ARAO TATSUYA, ISOBE ATSUO, TAKAYAMA TORU
Format Patent
LanguageEnglish
Japanese
Published 28.04.2016
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Summary:PROBLEM TO BE SOLVED: To provide an inexpensive semiconductor device by realizing a further low temperature process (350°C or less, preferably, 300°C or less).SOLUTION: After forming a semiconductor layer 103 having crystalline structure, a p-type impurity element and a hydrogen element are added simultaneously to one part of the semiconductor layer 103 having a crystalline substance, by using an ion doping method, to form an impurity region 107 (a region having an amorphous structure), and then heat treatment at 100-300°C is performed to form a low-resistance and amorphous impurity region 108, and the impurity region 108 is made a source region or a drain region of a TFT while being left as an amorphous region.SELECTED DRAWING: Figure 1 【課題】さらなる低温プロセス(350℃以下、好ましくは300℃以下)を実現し、安価な半導体装置を提供する。【解決手段】本発明は、結晶構造を有する半導体層103を形成した後、イオンドーピング法を用いて結晶質を有する半導体層103の一部にp型不純物元素及び水素元素を同時に添加して不純物領域107(非晶質構造を有する領域)を形成した後、100〜300℃の加熱処理を行うことにより、低抵抗、且つ非晶質な不純物領域108を形成し、非晶質な領域のままでTFTのソース領域またはドレイン領域とする。【選択図】図1
Bibliography:Application Number: JP20150227249