SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To improve the performance of a semiconductor device.SOLUTION: A semiconductor device has: a substrate SUB composed of silicon; a semiconductor layer SL1 formed on the substrate SUB and composed of a p-type nitride semiconductor; and a transistor TR1 formed on the semiconductor...

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Bibliographic Details
Main Authors KUME IPPEI, TAKEUCHI KIYOSHI, HASE TAKU, NAGUMO TOSHIHARU
Format Patent
LanguageEnglish
Japanese
Published 04.04.2016
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Summary:PROBLEM TO BE SOLVED: To improve the performance of a semiconductor device.SOLUTION: A semiconductor device has: a substrate SUB composed of silicon; a semiconductor layer SL1 formed on the substrate SUB and composed of a p-type nitride semiconductor; and a transistor TR1 formed on the semiconductor layer SL1 and that includes a channel layer CH. In addition, the semiconductor device has: an n-type source region SR1 formed in the channel layer CH; and an n-type drain region DR1 formed in the channel layer CH so as to be separated from the source region SR1 in a plan view. Each of the source region SR1 and the drain region DR1 is contacted with the semiconductor layer SL1.SELECTED DRAWING: Figure 1 【課題】半導体装置の性能を向上させる。【解決手段】半導体装置は、シリコンからなる基板SUBと、基板SUB上に形成されたp型の窒化物半導体からなる半導体層SL1と、半導体層SL1上に形成されたチャネル層CHを含むトランジスタTR1と、を有する。また、半導体装置は、チャネル層CH中に形成されたn型のソース領域SR1と、チャネル層CH中に、平面視においてソース領域SR1と離れて形成された、n型のドレイン領域DR1と、を有する。ソース領域SR1およびドレイン領域DR1の各々は、半導体層SL1と接触している。【選択図】図1
Bibliography:Application Number: JP20140167708