POOR APPEARANCE DETERMINATION DEVICE, APPARATUS FOR PRODUCING FILM-LIKE OBJECT, AND POOR APPEARANCE DETERMINATION METHOD, AND METHOD FOR PRODUCING THE FILM-LIKE OBJECT

• Main Author: SHIMOKAWA DAISUKE
• Format: Patent
• Language: English; Japanese
• Published: 22.03.2016
• Subjects: AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING; PERFORMING OPERATIONS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR; SHAPING OR JOINING OF PLASTICS; TRANSPORTING; WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

PROBLEM TO BE SOLVED: To provide a poor appearance determination device and a poor appearance determination method which precisely detect a poor appearance causing part causing a poor appearance when a film-like object is rolled up, and an apparatus for producing the film-like object and a method for producing the film-like object capable of preventing occurrence of a poor appearance by the poor appearance failure-causing part.SOLUTION: A deviation at each measuring point is calculated at each clocking time change from a thickness of a film-like object at each measuring point in a scanning direction and an average value of thicknesses of the film-like objects in a scanning direction by calculation means. An average value of deviations at clocking time changes at same measuring points in a width direction of the film-like object is compared with a predetermined deviation threshold value. Measuring points where the average value of deviations exceeds the deviation threshold value are extracted as poor appearance candidates. When the poor appearance candidates continue, in the scanning direction, beyond a predetermined range, the continued measuring points are determined as poor appearance causing parts.SELECTED DRAWING: Figure 6 【課題】フィルム状物を巻き取った際に外観不良を誘因する外観不良誘因部を精度よく検知する外観不良判定装置及び外観不良判定方法を提供する。外観不良誘因部による外観不良の発生を防止可能なフィルム状物の製造装置及びフィルム状物の製造方法を提供する。【解決手段】演算手段によって、走査方向における各測定点でのフィルム状物の厚みと、走査方向におけるフィルム状物の厚みの平均値から、各測定点における偏差を計時変化ごとに求め、各測定点において、フィルム状物の幅方向における同一測定点の計時変化での偏差の平均値を、所定の偏差閾値と比較して、偏差の平均値が偏差閾値を超えた測定点を外観不良候補として抽出し、外観不良候補が、走査方向において、所定の範囲を超えて連続した場合に、連続した測定点を外観不良誘因部と判定する。【選択図】図６