ELECTRONIC DEVICE

PROBLEM TO BE SOLVED: To provide an electronic device which is excellent in sealing performance even under a changing environment.SOLUTION: In the electronic device having a body unit on a substrate 1 sealed by a sealing material 3, the substrate 1 and the sealing material 3 are bonded in a manner t...

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Bibliographic Details
Main Author ITO HIROHIDE
Format Patent
LanguageEnglish
Japanese
Published 21.12.2015
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Summary:PROBLEM TO BE SOLVED: To provide an electronic device which is excellent in sealing performance even under a changing environment.SOLUTION: In the electronic device having a body unit on a substrate 1 sealed by a sealing material 3, the substrate 1 and the sealing material 3 are bonded in a manner to sandwich an extraction electrode 4 formed to expose from the body unit. The thickness of a junction 5 between the substrate 1 and the sealing material 3 is within the range of 0.1 to 100.0 nm. The sealing material 3 includes a gas barrier layer 32 and a support medium 31 for the gas barrier layer 32. The Young's modulus of the support medium 31 at a temperature of 25°C is within the range of 0.1-3.5 GPa. 【課題】本発明の課題は、変化する環境下においても封止性能に優れた電子デバイスを提供することである。【解決手段】基板1上の本体ユニットが封止材3によって封止された電子デバイスであって、前記基板1と前記封止材3とが、前記本体ユニットから露出するように形成された引き出し電極4を挟んで接合され、前記基板1と前記封止材3の接合部5の厚さが、0.1〜100.0nmの範囲内にあり、前記封止材3が、ガスバリアー層32と、当該ガスバリアー層32の支持体31とを備え、前記支持体31の温度25℃におけるヤング率が、0.1〜3.5GPaの範囲内にあることを特徴とする電子デバイス。【選択図】図2
Bibliography:Application Number: JP20140117522