SCANNING TYPE MICROSCOPE SYSTEM AND CONTROL METHOD FOR SCANNING TYPE MICROSCOPE SYSTEM

• Main Authors: MAEDA FUMISADA, FUJITA GORO
• Format: Patent
• Language: English; Japanese
• Published: 21.12.2015
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICS; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To optimally control the synchronous signal of sampling and the light emission pattern of intermittent light emission in a scanning type microscope system.SOLUTION: A scanning type microscope system includes: an emission part for emitting a laser beam; a light emission part for intermittently emitting the laser beam to be emitted from the emission part; a detector for converting a fluorescent body excited from an object by receiving the intermittently emitted laser beam into an electric signal; a sampling part for sampling the electric signal on the basis of a predetermined synchronous signal; and a light emission pattern control part for controlling the light emission pattern of intermittent light emission by the light emission part on the basis of the synchronous signal. 【課題】走査型顕微鏡システムにおけるサンプリングの同期信号と間欠発光の発光パターンとを最適に制御する。【解決手段】本開示に係る走査型顕微鏡システムは、レーザー光を出射する出射部と、前記出射部から出射されるレーザー光を間欠発光させる発光部と、間欠発光された前記レーザー光を受けて対象物から励起した蛍光体を電気信号に変換する検出器と、前記電気信号を所定の同期信号に基づいてサンプリングするサンプリング部と、前記同期信号に基づいて前記発光部による前記間欠発光の発光パターンを制御する発光パターン制御部と、を備える。【選択図】図９