METHOD FOR MEASURING MECHANICAL ERROR OF ROTATING TABLE AND METHOD FOR MACHINING PERIPHERAL EDGE OF PLATE

PROBLEM TO BE SOLVED: To provide a method for measuring a rotation angle error (angle runout) and a rotation center error (center runout) with the rotation of a rotating table by using a measuring substrate capable of being simply made, and to provide a method for machining a peripheral edge of a pl...

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Bibliographic Details
Main Authors NISHIMURA NAOTSUGU, SAKAI TOMOKI
Format Patent
LanguageEnglish
Japanese
Published 14.12.2015
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Summary:PROBLEM TO BE SOLVED: To provide a method for measuring a rotation angle error (angle runout) and a rotation center error (center runout) with the rotation of a rotating table by using a measuring substrate capable of being simply made, and to provide a method for machining a peripheral edge of a plate and containing the above method.SOLUTION: A measuring substrate displaying a circular mark on a virtual circle centering on a point to serve as a rotation center when carried in a rotating table of a machining machine is fixed on the table intended to measure an error of a rotation angle, the circular mark is read by using a camera being set in a fixed position every time the table rotates by a predetermined angle, carrying-in error of the measuring substrate to the table top is detected from the position of the mark that is read, and the angle runout and center runout of the table are detected from the position of the mark after being corrected by the detected carrying-in error. As the measuring substrate, the substrate displaying multiple circle marks at a predetermined equally divided angle on the virtual circle and the substrate displaying one mark on the virtual circle can be used. 【課題】簡易に製作できる測定用基板を用いて、回転テーブルの回転に伴う回転角の誤差(角度振れ)及び回転中心の誤差(心振れ)を測定する方法及び当該方法を含む板材の周縁加工方法を提供する。【解決手段】加工機の回転テーブルに搬入されたときの回転中心となるべき点を中心とする仮想円上に円形マークを表示した測定用基板を、回転角度の誤差を測定しようとするテーブルに固定し、テーブルを所定角回転する毎に定位置に設定したカメラで円形マークを読み取り、読み取ったマークの位置からテーブル上への測定用基板の搬入誤差を検出し、当該検出した搬入誤差で補正した後の前記マークの位置からテーブルの角度振れ及び心振れを検出する。測定用基板としては、仮想円上に所定の等分割角度で複数の円形マークを表示した基板や、仮想円上に1個のマークを表示した基板を用いることができる。【選択図】図8
Bibliography:Application Number: JP20140111572