DESIGN AID METHOD, DESIGN AID PROGRAM AND DESIGN AID DEVICE

PROBLEM TO BE SOLVED: To specify a spot where chromium migration is generated remarkably, from inside a layout area.SOLUTION: Wiring wa-wf is arranged in a layout area r shown by (a) of figure 1. As shown by (b) of the figure 1, a design aid device 101 specifies wiring wa_1, wb_1, wb_2, wd, we_1 fro...

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Bibliographic Details
Main Author MIYAJIMA MASAAKI
Format Patent
LanguageEnglish
Japanese
Published 03.12.2015
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Summary:PROBLEM TO BE SOLVED: To specify a spot where chromium migration is generated remarkably, from inside a layout area.SOLUTION: Wiring wa-wf is arranged in a layout area r shown by (a) of figure 1. As shown by (b) of the figure 1, a design aid device 101 specifies wiring wa_1, wb_1, wb_2, wd, we_1 from the layout area r as a wiring group in which each linear wiring having a length longer than a prescribed length is arranged adjacently at a prescribed wiring interval or less from the wiring wa-wf. A user of the design aid device 101 can determine easily a measuring point by browsing the wiring wa_1, wb_1, wb_2, wd, we_1 specified by the design aid device 101. 【課題】レイアウト領域内からクロムマイグレーションが顕著に発生する箇所を特定することを図ること。【解決手段】図1の(a)に示すレイアウト領域rには、配線wa〜wfが配置されている。図1の(b)に示すように、設計支援装置101は、レイアウト領域rから、配線wa〜wfから、所定長以上の長さを有する直線状の配線が所定の配線間隔以下で隣接して配置された配線群として、配線wa_1、wb_1、wb_2、wd、we_1を特定する。設計支援装置101の利用者は、設計支援装置101が特定した配線wa_1、wb_1、wb_2、wd、we_1を閲覧して、測定ポイントを容易に決定することができる。【選択図】図1
Bibliography:Application Number: JP20140098489