TEMPERATURE HISTORY STORAGE DEVICE

• Main Author: HIROSHIMA YASUSHI
• Format: Patent
• Language: English; Japanese
• Published: 03.12.2015
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRICITY; MEASURING; MEASURING QUANTITY OF HEAT; MEASURING TEMPERATURE; PHYSICS; RESISTORS; TESTING; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR

PROBLEM TO BE SOLVED: To easily determine whether or not a temperature history in which a measuring object portion goes over a prescribed temperature is experienced.SOLUTION: A temperature history storage device includes a series circuit with an electric current fuse element (F) and an NTC thermistor element (NT) having a negative temperature coefficient (NTC). A voltage applied to the series circuit is denoted by V. The NTC thermistor element (NT) has a resistance value Rin the temperature lower than a prescribed temperature T, and a resistance value Rin the temperature higher than the prescribed temperature T. When the internal resistance value of the electric current fuse element (F) is denoted by R, a rating electric current Iof the electric current fuse element (F) is expressed by V/(R+R)<I<V/(R+ R). 【課題】測定対象部位が所定の温度を超える温度履歴を経たか否かを簡単に判定可能とする。【解決手段】電流ヒューズ素子（F1）と負の温度係数（NTC）を持つNTCサーミスタ素子（NT1）との直列回路を含み、前記直列回路に印加される電圧をＶとし、前記NTCサーミスタ素子（NT1）は、所定温度Tcより低い温度で抵抗値Rntlを、前記所定温度Tcより高い温度で抵抗値Rnthを有し、電流ヒューズ素子（F1）の内部抵抗値がRf1である時、前記電流ヒューズ素子（F1）の定格電流Irは、V / (Rf1+ Rntl) < Ir< V / (Rf1+ Rnth) であることを特徴とする温度履歴記憶装置。【選択図】図１Ａ