SAMPLE FABRICATION DEVICE, AND SAMPLE FABRICATION METHOD

PROBLEM TO BE SOLVED: To provide a sample fabrication device capable of stable supply of a standard substance containing a trace amount of samples.SOLUTION: A sample fabrication device comprises: a conductive substrate which is coated by an insulator, and provided with a through-hole; an electrode p...

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Main Authors YOSHII JUNJI, TANIGUCHI MASATERU, NUNOFUJI SATOSHI, KITSUTA KAZUMI, RYUZAKI SO, TAKABATAKE REONA, MANO JUNICHI, NAKAE HIROKI, KAWAI TOMOJI
Format Patent
LanguageEnglish
Japanese
Published 12.11.2015
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Summary:PROBLEM TO BE SOLVED: To provide a sample fabrication device capable of stable supply of a standard substance containing a trace amount of samples.SOLUTION: A sample fabrication device comprises: a conductive substrate which is coated by an insulator, and provided with a through-hole; an electrode pair arranged so as to sandwich the conductive substrate; and a current detector which is connected to the electrode pair and measures changes of an ion current value when the sample passes through the through-hole. The molecule number of the sample having passed through through-hole is measured by measuring changes of an ion current value. Thus, a sample whose molecule number was measured is fabricated. 【課題】ごく微量の試料を含む標準物質の安定供給を可能にすることのできる試料作製装置の提供。【解決手段】絶縁体でコートされ、貫通孔が設けられた導電性基板と、導電性基板を挟むように配置された電極対と、電極対に接続され、試料が貫通孔を通過するときのイオン電流値の変化を測定する電流検出装置を備える試料作製装置。イオン電流値の変化を測定することにより、貫通孔を通過した試料の分子数が測定される。これにより、分子数測定済みの試料が作製される。【選択図】図1
Bibliography:Application Number: JP20150072796