TESTING CIRCUIT AND TESTING METHOD FOR FUSE ELEMENT
PROBLEM TO BE SOLVED: To discriminate a fuse element having manufacturing failures.SOLUTION: A testing circuit for a fuse element comprises: a program transistor 102 connected with one end of a fuse element 112; a reading current source 104 that is connected with one end of the fuse element in paral...
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Main Authors | , |
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Format | Patent |
Language | English Japanese |
Published |
05.10.2015
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To discriminate a fuse element having manufacturing failures.SOLUTION: A testing circuit for a fuse element comprises: a program transistor 102 connected with one end of a fuse element 112; a reading current source 104 that is connected with one end of the fuse element in parallel to the program transistor 102, and that supplies a power to the fuse element; a data sense circuit 106 connected with one end of the fuse element; a selection transistor 108 connected the other end of the fuse element; and a determination unit 110 that determines a cutoff state of the fuse element on the basis of a required time from when the fuse element is selected by the selection transistor 108 and the program transistor 102 is turned off to when a voltage at the other end of the fuse element becomes equal to or less than a sense voltage for determining that the fuse element is cut off.
【課題】製造不良のフューズ素子を判別すること。【解決手段】フューズ素子112の一端に接続されるプログラム用トランジスタ102と、フューズ素子の一端にプログラム用トランジスタ102と並列に接続され、フューズ素子に電力を供給する読み出し用電流源104と、フューズ素子の一端に接続されるデータセンス回路106と、フューズ素子の他端に接続される選択用トランジスタ108と、選択用トランジスタ108によってフューズ素子が選択されるとともにプログラム用トランジスタ102がオフとなってから、フューズ素子の他端の電圧が、フューズ素子が切断されたことを判断するための電圧であるセンス電圧以下となるまでの所要時間に基づいて、フューズ素子の切断状態を判定する判定部110とを備えるフューズ素子のテスト回路。【選択図】図1 |
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Bibliography: | Application Number: JP20140050303 |